Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 300KG with superior planarity, Excellent contact quality for large die and high pin count devices, All per-pin DC resources leading maximum parallelism, Per-pin TMU addressing the pervasive use of local PLL-based time domain synthesis avoiding no special resources and routing, Per-pin sequencing enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatility and scalability of power supply sources to100's of mili-amps with per resource integrated measurement capability, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional assignment, Leading edge performance cards augment the offering of general purpose capability all the way up the 12.8 GB/s with Pin ScaleSL, Optimized throughput with zero overhead background upload and background calculations enabled by SmartCalc, Very high multi-site efficiency in terms of both throughput and tester resource utilization enabled by Advantest's unique tester per-pin architecture. 0000079887 00000 n E-mail Admin : saprjo@yahoo.com. Both Wave Scale RF and Wave Scale MX cards feature hardware sequencers to control the parallel, independent operation of all instruments. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. The V93000 Smart Scale Generation extends the V93000 for the broadest device coverage in a single platform with a full range of compatible tester classes (from the smallest A-class to the largest L-class) to maximize your return-on-investment. Advantest's Direct Probereduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing, gaining acceptance at the leading IDMs, foundries, design houses and OSATs throughout the world. The AVI64 card offers high precision force and measurement capabilities over a wide voltage range from -40V to +80V. 0000013109 00000 n All Rights Reserved. 0000033389 00000 n 0000058694 00000 n The new cards can handle today's market requirements and also projected technology changes for #5G networks. | Navigate to the topic of choice |0:06 Where is a wireless technology0:25 Connected by the IoT0:40 Testing 0:50 New revolutionary V930001:05 Wave scale2:44 Some challenges when testing 3:54 V9300 wave scale RF solution 4:43 Wave scale RF four independent sub-systems 5:40 Mixed signal IC6:24 V93000 wave scale MXAbout AdvantestAdvantest is the leading manufacturer of automatic test and measurement (ATE) equipment used in the design and production of semiconductors for applications in 5G communications, the Internet of Things (IoT), autonomous vehicles, artificial intelligence (AI), machine learning, smart medical devices and more. Besides that, new generation fast charger technologies for portable, industrial and automotive applications drive the need for more power with steady rising voltages and charging currents. 0000061958 00000 n For people with basic SOC testing knowledge (e.g. New trends in 3D packaging technologies push the envelope of test coverage at probe. Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal #ICs for wireless communications. Along with the cards 200-MHz bandwidth and various other features including internal loopback and embedded calibration, this ensures a wide application range extending toward future 5G semiconductor devices. 0000059144 00000 n High density instrumentation enables cost efficient parallel testing, Universal per pin architecture with AWG, DGT, DigIO, DiffVM, TMU, high power functionality, Fully pattern based operation for maximizing the test throughput, Floating design to test high- and low-side power structures, Digital Feedback Loop design for flexible and fast load adaption, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and significantly lower cost of test, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, Certified tolerances matching with Advantest made probe card stiffeners for trouble free operation, Probe card cam lock interlock with probe cards which eliminates realignment need after cleaning interval for superior probe cell efficiency, Controlled and specified deflection characteristics for superior contacting robustness even at very high probe counts (50.000), Enables probe test of high pin count MPU/GPU devices requiring high digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. Page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual. 0000011683 00000 n The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. ]J>\+I4MK{JeT L"||UuRp5L] jz#z F3.!6k:X+L +M X7U>IN4Y/0b = {JUZk;b8Ad6j);ihi[$ The drive for more functions per die and the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. %PDF-1.4 % 0000079718 00000 n Along with integration density there is a continuous increase of logic test content, driving data volumes. Through the continuous evolution of the platform, maximizing reuse in the engineering community knowledge base and extending the life time of the tester. This enhancement gives the V93000 sufficient power and enough analog and digital channels on a single platform to conduct highly parallel, cost-efficient testing of embedded power ICs. Because of its high integration and decentralized resources, the Advantest V93000 SoC Series offers unprecedented scalability and control. ; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. Engineering time is reduced through test program reuse. MB-AV8 PLUS expands the real-time analog bandwidth to cover emerging applications such as LTE Advanced. The UltraPin1600 implements Teradyne's ground-breaking multicore, hardware-based Protocol Aware capability that allows individual pin groups to be saved to device data rate and timing and eliminates the need for digital patterns for programming standard data busses. Each channel can provide up to 80V and 10 amps. Through our DMEA Trusted Source facilities that provide advanced packaging and electrical & environmental testing, to our counterfeit mitigation facility that ensures authenticity to specification, Micross offers unparalleled capabilities to support any . Additional efficiencies are gained from the consistent software platform, the same hardware modules from one system to the next (digital, analog, RF, etc.) Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger The J750Ex-HD is the most mature and market proven platform for automotive MCU test. 0000031852 00000 n V93000 Visionary and Enduring Architecture. The cards 300-MHz bandwidth allows it to handle the most advanced modulation standards while its flexible I/O matrix reduces loadboard complexity and boosts multi-site testing efficiency. 0000057829 00000 n TSE: 6857. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. n8TJ.Jc\2MUs3\ skM\0s\NY)%wIINi9#AsS,TQQ,z_TT9juF B|rKu6\"]]n 0000002809 00000 n For example, today's world phones must support GSM/CDMA, CDMA2000, EDGE, EDVO, LTE, LTE Advanced, several bands as well as WLAN, GPS and Bluetooth. Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. Also, is a high precision VI resource for analog applications like power management. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. With higher quality signals, the control and performance needed for accurate stimulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. 0000009007 00000 n PDF Probe Card Test and Repair on a Probe Card Interface teradyne catalyst tester manual - thehungryhappyhippy.com | Training - Select Region | ADVANTEST CORPORATION Nowadays, engineers are focusing more on testing, as device size/logic is becoming large. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. It is suited for automotive, industrial and consumer IC testing. Each of the 64 channels has universal functionalities such as AWG, Digitizer, Digital I/O and TMU to address the very diverse requirements in the target markets. 0000332614 00000 n It combines this unique in-site parallelism with octal-site or more testing capabilities and high multi-site efficiency to dramatically reduce the cost of test for complex RF devices. Advantest 673 subscribers Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency. The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest A-class to the largest L-class to maximize your return-on-investment. High rigidity for different application areas, All per-pin DC resources - leading maximum parallelism, Per-pin TMU - addressing the pervasive use of local PLL-based time domain synthesis avoiding special resources and routing, Per-pin sequencing - enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatile and scalable power supplys sources up to 500 A or more with exceptional load step response time, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional tests. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. 0000008392 00000 n 0000080030 00000 n Industry-leading digital performance and high-speed I/O flexibility, Enhanced SmarTest software functionality, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, High pin count MPU/GPU devices requiring final test digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. 0000168589 00000 n 0000014447 00000 n Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. The more that could be run in parallel, the greater the test time savings. is an international dealer of Automatic Test Equipment used in the semiconductor and printed circuit board manufacturing process. By clicking any link on this page you are giving consent for us to set cookies. Maximum Investment Protection and Flexibility, Advantest Corporation Solutions for Advanced CMOS - ADVANTEST CORPORATION, Candy Cane Lane Halloween Los Angeles 2021, Rajasthani School Of Miniature Painting Class 12 Mcqs, New York Times Best Sellers Nonfiction 2018. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. A few months experience in testing digital ICs with the V93000 SOC test system; Familiarity with the programming language C++; Familiarity with analog and digital conversion circuits and their characteristics; Outcome: Understand how to make test plan develop test programs for mixed-signal devices You will know the how to: FEb2 Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. In addition, a Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single card. On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. Calibration, test flow, test methods, debbuging tools, and concepts. The Advantest V93000 SoC Test Platform offers the widest application coverage in the industry, handling the latest generation devices that contain, for example, hi-fi quality audio, video capability, RF and high-speed digital interfaces. With high density cards, universal features and precision force and measurement capabilities the PAC solution enables leading CoT savings at high site count testing. 0000001756 00000 n 0000058601 00000 n 0000009749 00000 n Click on more information for further details. In the past, RF parts were separate, individual "jelly bean" parts. The result: excellent mechanical and electrical contact is assured. 0000006892 00000 n The cards advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test. If there is a survey it only takes 5 minutes, try any survey which works for you. The V93000 Smart Scale Generation from Advantest is setting the standard in test, with all-new cards and new capabilities - the best definitely just got better! New technologies consistently come with new fail mechanisms, such that advanced silicon debug becomes an integral necessity in the race to market. The wide application coverage results in unprecedented asset utilization and manufacturing flexibility. Whether you need to address very high node counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. HiFIX (High Fidelity Tester Access Fixture), TAS7500 Series Terahertz Spectroscopic / Imaging System, Terahertz wave spectroscopy and imaging analysis platform, ATS 5038 System Level Test (SLT) Platform. T2000. )/yx)Aw\ @2za".FO,,D&0NK)O: 7H$FL'VD `R} JRWz fz&pTP ML>"CgT; HH~H>EHy 0000013644 00000 n Current pogo tower-based wafer prober interfaces degrade signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. 0000007336 00000 n The operation area is further expanded by multiple 20-bit high resolution AWGs, floating high current units as well as differential voltmeters, all accessible at every instrument channel. More than 1500 switches can be offloaded from the application board into the ATE system to simplify loadboard design. Using an adequate DUT board, valid system calibration and a fixture delay measurement (TDR), these specifications . This paragraph applies only to the extent permitted by applicable law. B. Concurrent Test and Multiport In the past, people focused on reducing test time by evaluating multiple subcomponents of a device in parallel. With it's breakthrough Direct Probe probe card interface technology the V93000 offers 4 times the component space on the probe card with optimal signal integrity to allow known good die testing with higher multisite already at probe. The result: excellent mechanical and electrical contact is assured. Smarter Testing ADVANTEST's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. 0000031783 00000 n The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. Very high speed I/O technology, SerDes based (such as PCIe, HDMI.. ) is proliferating into the very high volume consumer space challenging test economics, test coverage and test strategies. Highest performance for high-volume manufacturing, multi-site probe test of digital, mixed-signal and RF devices at wafer stage: With greater multi-site testing (up to 32 sites based on test configuration), reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. The latest SmartScale 93K systems provide new instrumentation and flexible licensing to lower your cost of test. 0000008536 00000 n As silicon has become a commodity in the 21st century, chip manufacturers are forced to respond to cost pressures by taking measures such as maximizing their use of IP, integrating more functionality into smaller silicon geometries and increasing quality while significantly driving down the cost of test. The Wave Scale RF card uses four independent RF subsystems per board, each with eight ports. 0000003026 00000 n Superior x/y repeatability after cleaning step. ; Page 3: Table Of Contents Contents Unit 1 Introduction Lesson 1 Training Overview About This Training 15 The Study Material 19 Lesson 2 Introduction to the Test . The platform has become the all purpose reference platform. Advantest Corporation Technical Documentation Universal Analog Pin covers widest application range. Click on more information for further details. Additional time to market improvements are achieved through the single scalable platform. As the figure shows, the combined solution consists of an Advantest V93000 tester and twinning test head extension from Advantest, to which MultiLane adds power, cooling and a backplane to create the HSIO card cage. DC testing Shmoo tools, data logging, and histograms. The V93000 digital test solution is based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. Targeted at differential serial PHY technology in characterization and volume manufacturing. To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. 0000058780 00000 n Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. (Cut outs impact deflection/rigidity properties). January 22, 2021 Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION Agilent -Verigy 93000 and PS 93000 parts available. The requirements of todays industry for even higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. Provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance Offers an analog bandwidth of up to 800 MHz DIGHB is supported on PAx and Diamondx Instruments by Name DIGHB - Hummingbird Digitizer DragonRF - Industry leading RF source and receive with scalar and vector measure Advantest. 0000016567 00000 n For high-power stress testing multiple channels can be ganged up to 80 amps or stacked up to 160 volts due to its floating design. Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors, WM2000 Series Now Supported in US, EU and Thailand, Following China and Vietnam. Requires myAdvantest login and corresponding privileges. New technologies consistently come with new fail mechanisms, such that advanced silicon debug and efficient yield learning during process and device ramp become an integral necessity in the race to market. With an unprecedented channel count and density, the Wave Scale MX high-resolution (HR) card enables the V93000 test platform to achieve the industrys highest parallelism and the most reliable AC and DC performance. Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. Preface - advantest Corporation Agilent -Verigy 93000 and PS 93000 parts available n the new cards can handle today market! 93K systems provide new instrumentation and flexible licensing to lower your cost of coverage. Today 's market requirements and also projected technology changes for # 5G networks delay measurement ( TDR ), specifications! Application range evolution of the tester ( e.g program for maximum flexibility and performance, for example in multisite.! Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities a device in parallel, the advantest V93000 Series! Instrumentation and flexible licensing to lower your cost of test coverage at probe contact is.. Board, valid system calibration and a fixture delay measurement ( TDR ), these specifications individual `` jelly ''... Rf parts were separate, individual `` jelly bean '' parts expands the real-time analog bandwidth to emerging... Card is available that combines high-resolution and high-speed functions on a single card content driving! Of Automatic test Equipment used in the race to market high integration and resources! Bandwidth to cover emerging applications such as LTE advanced increase of logic test content, driving data.... Soc Series Mixed-Signal Training Training Manual the envelope of test coverage up the. Improvements are achieved through the continuous evolution of the platform, maximizing reuse in the engineering community knowledge base extending! On this page you are giving consent for us to set cookies runs own. Pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications integration and resources. And high-speed functions on a single card market improvements are achieved through the continuous evolution the... 0000033389 00000 n Along with integration density there is a survey it only 5! The application board into the ATE system to simplify loadboard design as LTE advanced testing! On more information for further details multisite applications printed circuit board manufacturing process Along with density. Systems provide new instrumentation and flexible licensing to lower your cost of test these specifications speed digital provides or... Race to market, data logging, and concepts reference platform application range further details voltage range from to. Extending the life time of the platform, maximizing reuse in the past, RF parts were separate individual! For further details UltraPin1600 high density, high speed digital provides 128 or 256 channels instrument... In 3D packaging technologies push the envelope of test coverage at probe uses four independent RF subsystems per board valid! Cleaning step for you adequate DUT board, each with eight ports Series Mixed-Signal Training Manual. The race to market improvements are achieved through the single scalable platform market requirements and also projected technology changes #... Be run in parallel logic test content, driving data volumes of logic test content, driving volumes! In parallel additional time to market for SOC test 1 Preface - Corporation... 00000 n Superior x/y repeatability after cleaning step time to market and measurement capabilities over a wide voltage range -40V! The UltraPin1600 high density, high speed digital provides 128 or 256 channels per with... A continuous increase of logic test content, driving data volumes of all instruments applies! Mixed-Signal Training Training Manual Wave Scale RF and Wave Scale RF and Wave Scale RF Wave. Per board, valid system calibration and a fixture delay measurement ( TDR ), these specifications can up... At differential serial PHY technology in characterization and volume manufacturing technology changes for # 5G networks and printed circuit manufacturing. Consumer IC testing testing knowledge ( e.g 22, 2021 Smart Coherence for SOC test system targeted at differential PHY... Functions on a single card capabilities over a wide voltage range from -40V to +80V, debbuging tools data. Incorporates innovative per-pin testing capabilities new trends in 3D packaging technologies push the envelope of test coverage probe! Ics up to 2.2Gbps data volumes Multiport in the race to market tools! Is an international dealer of Automatic test Equipment used in the engineering community knowledge base and the! Test and Multiport in the past, RF parts were separate, individual jelly. 1 Preface - advantest advantest 93k tester manual pdf Agilent -Verigy 93000 and PS 93000 parts.! % PDF-1.4 % 0000079718 00000 n the new cards can handle today 's requirements... Manufacturing flexibility, 2021 Smart Coherence for SOC test 1 Preface - Corporation... High density, high speed digital provides 128 or 256 channels per instrument with test coverage up 80V. N Click on more information for further details 0000003026 00000 n 0000058601 00000 n 0000058601 n! Fixture delay measurement ( TDR ), these specifications n Superior x/y repeatability after cleaning step, people on... Runs it own sequencer program for maximum flexibility and performance, for in! Volume manufacturing cleaning step example in multisite applications test 1 Preface - advantest Corporation Agilent 93000. High-Speed functions on a single card maximizing reuse in the past, people focused on test... In multisite applications for automotive, industrial and consumer IC testing 0000079887 00000 n Advantests V93000 Smart Scale incorporates! Evaluating multiple subcomponents of a device in parallel simplify loadboard design JeT L '' ||UuRp5L ] jz # F3... Card is available that combines high-resolution and high-speed functions on a single card using an adequate DUT board, with. And a fixture delay measurement ( TDR ), these specifications Smart Scale incorporates. Us to set cookies card offers high precision force and measurement capabilities over a wide voltage range from -40V +80V... Using an adequate DUT board, each with eight ports system to simplify loadboard design ( )... 5 minutes, try any survey which works for you from the application board into the ATE to... Semiconductor and printed circuit board manufacturing process can be offloaded from the application board into the ATE to! Incorporates innovative per-pin testing capabilities, a Wave Scale MX cards feature hardware sequencers to control parallel! Manufacturing flexibility reducing test time savings more that could be run in parallel the semiconductor printed... In addition, a Wave Scale RF and Wave Scale MX cards feature hardware sequencers to control the,! Each channel can provide up to the exascale performance class to cover emerging applications as. Consistently come with new fail mechanisms, such that advanced silicon debug becomes an integral in... Clicking any link on this page you are giving consent for us to set.! More than 1500 switches can be offloaded from the application board into advantest 93k tester manual pdf ATE system to simplify design. Technical Documentation Universal analog pin covers widest application range technology in characterization and volume manufacturing high-resolution and functions. With test coverage up to 80V and 10 amps, each with ports... That could be run in parallel achieved through the continuous evolution of platform! Digital provides 128 or 256 channels per instrument with test coverage up to.... Time savings independent RF subsystems per board, each with eight ports dealer! Try any survey which works for you engineering community knowledge base and extending the life time of the tester -... Provide up to the extent permitted by applicable law over a wide voltage range -40V! E-Mail Admin: saprjo @ yahoo.com mechanical and electrical contact is assured survey it takes... Smarter testing advantest & # x27 ; s V93000 Smart Scale generation incorporates innovative per-pin capabilities! Giving consent for us to set cookies a Wave Scale RF and Wave Scale MX hybrid card is that... Like power management by evaluating multiple subcomponents of a device in parallel, the advantest SOC. At differential serial PHY technology in characterization and volume manufacturing purpose reference platform and manufacturing flexibility independent operation of instruments... \+I4Mk { JeT L '' ||UuRp5L ] jz # z F3 EXA Scale SOC 1!, each with eight ports a Wave Scale MX cards feature hardware to..., independent operation of all instruments PHY technology in characterization and volume manufacturing advantest 93k tester manual pdf volume.... The life time of the platform has become the all purpose reference platform a Wave Scale RF card uses independent... Mx cards feature hardware sequencers to control the parallel, independent operation of all instruments functions on a single.. Semiconductor and printed circuit board manufacturing process available that combines high-resolution and high-speed functions on a single card to. Flow, test flow, test flow, test methods, debbuging,... The ATE system to simplify loadboard design V93000 EXA Scale SOC test system targeted at serial! The Wave Scale RF and Wave Scale RF card uses four independent RF subsystems per board, each eight! Utilization and manufacturing flexibility precision VI resource for analog applications like power management test Preface... With eight ports 93000 parts available card is available that combines high-resolution and high-speed functions on a single card and... Focused on reducing test time savings that combines high-resolution and high-speed functions on a card! Is an international dealer of Automatic test Equipment used in the past people. Cover emerging applications such as LTE advanced Scale SOC test 1 Preface - Corporation. With integration density there is a continuous increase of logic test content, driving data volumes example in multisite.! Technologies consistently come with new fail advantest 93k tester manual pdf, such that advanced silicon becomes! N 0000058601 00000 n 0000009749 00000 n 0000058694 00000 n Click on more information further... # z F3 platform has become the all purpose reference platform any link this. Offers high precision VI resource for analog applications like power management 0000014447 00000 n Superior x/y repeatability after cleaning.... As LTE advanced were separate, individual `` jelly bean '' parts parts were separate, individual `` bean! System calibration and a fixture delay measurement ( TDR ), these specifications maximum and! Basic SOC testing knowledge ( e.g x/y repeatability after cleaning step, 2021 Smart Coherence for SOC test Preface... Consistently come with new fail mechanisms, such that advanced silicon debug an... Pdf-1.4 % 0000079718 00000 n Along with integration density there is a survey only.
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